Course Detail
Units:
3.0
Course Components:
Activity
Enrollment Information
Enrollment Requirement:
Prerequisites: "C-" or better in CS 3700 OR ECE 3700
Description
Study of failure and fault models in digital circuits, stuck-at-faults, transition faults, transistor faults, combinational/sequential circuit ATPG, FSM testing, design fault test, LFSR and BIST, equivalence checking, BDDs, BMDs, canonical representations of Boolean functions.