Course Detail
Units:
3.0
Course Components:
Activity
Enrollment Information
Enrollment Requirement:
Prerequisite: ECE/CS 3700.
Description
Study of failure and fault models in digital circuits, stuck-at-faults, transition faults, transistor faults, combinational/sequential circuit ATPG, FSM testing, design fault test, LFSR and BIST, equivalence checking, BDDs, BMDs, canonical representations of Boolean functions.